Subject Code:ML6P001 Name: Materials
Characterization Laboratory		 L-T-P: 0-0-6 Credit: 4
Pre-requisite(s): None
Optical microscopy: micro-etching techniques for ferrous and non-ferrous alloys, dark/bright field imaging, differential interference contrast technique, phase contrast technique; Scanning electron microscopy: sample preparation techniques, secondary electron and backscattered electron imaging, point, line and area mapping, X-ray mapping; Transmission electron microscopy: sample preparation, bright/dark field imaging, weak beam technique; X-ray Diffraction: crystallite size calculation, residual stress calculation; Optical emission spectroscopy: calibration using primary standards and measurement; Differential Scanning Calorimetry: sample preparation, determination of thermodynamic parameters, measurements on precipitation hardened Al alloys.

Texts / Reference Books:
  1. J. Goldstein, D.E. Newbury, D.C. Joy, C.E.Lyman,P.Echlin,E. Lifshin, L. Sawyer, J.R. Michael, Scanning Electron Microscopy and X-ray Microanalysis.
  2. ASM Handbooks Online
  3. David B. Williams, C.Barry Carter, Transmission Electron Microscopy: A Textbook for Materials Science (4 Vol. Set).
  4. G. Hohne, W.F. Hemminger, H. –j Flammersheim, Differential Scanning Calorimetry.
  5. O. Engler, V. Randle Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping.
  6. B.D. Cullity, C.R. Stock, Elements of X-Ray Diffraction.