Production and detection of X-rays; Crystallography: lattice, motif, unit cells and crystal structures, symmetry elements, point groups, space groups, defects; Diffraction: Wave theory and electromagnetic waves, single crystal diffraction method and applications, powder diffraction method and applications, indexing of powder diffraction patterns, Bragg’s law and Laue equation, reciprocal space and its application; Fourier transforms: analysis of diffraction patterns, structure factor and pair distribution function; Determination of crystal structures from symmetry and geometry; Rietveld method and precise crystal structures; Qualitative and quantitative phase identification.
Texts / Reference Books:
- B. E. Warren, X-Ray Diffraction.
- B. D. Cullity, S.R. Stock, Elements of X-ray diffraction.
- Buerger, Martin J, Elementary Crystallography: An Introduction to the Fundamental Geometrical Features of Crystals.
- F. C. Phillips, An Introduction to Crystallography.
- Norman ,F. M., and Kathleen Lonsdale, International Tables for X-Ray Crystallography. Vol. 1
- International Tables for Crystallography/ Volumes A(2006) / A1(2011) / B(2010) / C(2006)/ D(2006) / E(2010) / F(2012) / G(2006).
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