Subject Code: ML6L003	Name: Materials Characterization	L-T-P: 3-1-0	Credit: 4
Pre-requisite(s): None
Importance of characterization studies in materials science – applications in industry and research; Review of materials science fundamentals; Mechanical waves and Ultrasonic testing; Principles of image formation and optical aberrations; Sample preparation techniques for optical and scanning electron microscopy; Optical metallographic - phase contrast, Nomarski contrast techniques; Scanning electron microscopy: beam-sample interaction, Interaction volume concept, WDS, EDS, EPMA techniques and their application; X-ray diffraction – application in macro-texture, crystal structure and residual stress determination; Atomic absorption spectroscopy; Optical emission spectroscopy; X-ray fluorescence spectroscopy; Electron energy loss spectroscopy; Gas chromatography –application in dissolved gas analysis; Differential scanning calorimetry; Thermo gravimetric analysis; Surface analysis methods: AES, XPS; Transmission electron microscopy: sample preparation, bright field and dark field imaging, Kikuchi line formation and selected area diffraction analysis; Orientation imaging microscopy: sample preparation, application in micro-texture, phase, residual stress and grain size determination; Mass spectrometry. Texts / Reference Books: J. Goldstein, D.E. Newbury, D.C. Joy, C.E.Lyman,P.Echlin,E. Lifshin, L. Sawyer, J.R. M L Sawyer, J R Michael, Scanning Electron Microscopy and X-ray Microanalysis. ASM Handbooks Online David B. Williams, C.Barry Carter, Transmission Electron Microscopy: A Textbook for Materials Science (4 Vol. Set). G. Hohne, W.F. Hemminger, H. –j Flammersheim, Differential Scanning Calorimetry. O. Engler, V. Randle, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping. B.D. Cullity, C.R. Stock, Elements of X-Ray Diffraction