Determination of crystal structure from symmetry and geometry. Measurement of Axial ratios. X-ray diffraction: crystal size calculation, Single crystal and Powder diffraction method. Indexing and analysis of diffraction patterns.
Scanning electron microscopy: sample preparation techniques, secondary electron and back scattered imaging, point, line and area mapping.
Transmission electron microscopy; sample preparation, bright/dark field imaging. Differential Scanning Calorimetric; sample preparation, determination of thermodynamic parameters.
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